James J. Pao
at OEpic Semiconductors Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 28 February 2017 Paper
Proceedings Volume 10115, 1011519 (2017) https://doi.org/10.1117/12.2253565
KEYWORDS: Oxidation, Vertical cavity surface emitting lasers, Reliability, Manufacturing, Oxides, Semiconducting wafers, Resistance, Process control, Atmospheric propagation, Semiconductors, Picosecond phenomena, Quantum wells, Oxygen

Proceedings Article | 25 February 2017 Presentation + Paper
P. S. Wong, J. Yan, T. C. Wu, W. Kyi, J. Pao, M. Riaziat
Proceedings Volume 10122, 101220B (2017) https://doi.org/10.1117/12.2253053
KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Semiconductors, Gallium arsenide, Doping, Tellurium

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