Mr. Konstantin Ni. Galkin Profile

Konstantin Ni. Galkin

Post-graduate Student at Institute for Automation and Control Processes

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Publications (6)

Proceedings Article | 4 January 2019 Paper

Optical properties of TiO2 nanostructured films

Andrey Amosov, Irina Postnova, Konstantin Galkin, Vladimir Dzyuba, Yuri Kulchin, Yury Shchipunov

Proceedings Volume 11024, 1102403 (2019) https://doi.org/10.1117/12.2315435

KEYWORDS: Refractive index, Luminescence, Transmittance, Optical properties, Temperature metrology, Nanostructuring, Mica, Titanium dioxide, Crystals, Thin films

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Proceedings Article | 14 December 2016 Paper

Mg2SixSn1-xheterostructures on Si(111) substrate for optoelectronics and thermoelectronics

Nikolay Galkin, Konstantin Galkin, Sergey Dotsenko, Igor Chernev, Andrei Maslov, L. Dózsa, B. Pécz, Z. Osváth, I. Cora, D. Migas, R. Kudrawiec, J. Misiewicz

Proceedings Volume 10176, 1017604 (2016) https://doi.org/10.1117/12.2268266

KEYWORDS: Optoelectronics, Magnesium, Optical properties

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Proceedings Article | 8 June 2005 Paper

Growth and properties of silicon heterostructures with buried nanosize Mg2Si clusters

N. Galkin, K. Galkin

Proceedings Volume 5851, (2005) https://doi.org/10.1117/12.634543

KEYWORDS: Silicon, Magnesium, Annealing, Electrons, Silicon films, Dielectrics, Atomic force microscopy, Spectroscopy, Crystals, Reflectivity

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Proceedings Article | 8 June 2005 Paper

Solid phase growth and properties of Mg2Si epitaxial films on Si(111)

N. Galkin, S. Vavanova, K. Galkin, A. Maslov

Proceedings Volume 5851, (2005) https://doi.org/10.1117/12.634544

KEYWORDS: Silicon, Magnesium, Crystals, Annealing, Electrons, Silicon films, Absorption, Dielectrics, Thin films, Reflection

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Proceedings Article | 8 June 2005 Paper

Optical and structural properties of monocrystalline silicon wafers modified by compression plasma flow

N. Galkin, E. Chusovitin, K. Galkin, V. Astashinskii, E. Kostyukevich, A. Kuzmitski, A. Gerasimenko

Proceedings Volume 5851, (2005) https://doi.org/10.1117/12.634533

KEYWORDS: Plasma, Silicon, Crystals, Optical properties, Magnetism, Absorption, Semiconducting wafers, X-ray diffraction, Mirrors, Atomic force microscopy

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Proceedings Article | 17 June 2003 Paper

Electrical and optical properties of thick Mg2Si films on Si(111)

Nickolai Galkin, Svetlana Vavanova, Andrei Maslov, Konstantin Galkin

Proceedings Volume 5129, (2003) https://doi.org/10.1117/12.502403

KEYWORDS: Magnesium, Silicon, Oscillators, Silicon films, Absorption, Electrons, Refractive index, Dielectrics, Reflection, Semiconductors

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Showing 5 of 6 publications

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