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Prof. Manfred Paul Hentschel
at BAM
SPIE Involvement:
Author
Publications (5)
Proceedings Article | 9 May 2005 Paper
Direct iterative reconstruction of computed tomography trajectories (DIRECTT)
M. Hentschel, A. Lange, J. Schors
Proceedings Volume 5766, (2005) https://doi.org/10.1117/12.600888
KEYWORDS: Reconstruction algorithms, Sensors, Computed tomography, Detection and tracking algorithms, Tomography, Image resolution, Data modeling, Spatial resolution, CT reconstruction, Visual process modeling
Proceedings Article | 9 May 2005 Paper
X-ray diffraction topography image materials by molecular probe
Manfred Hentschel, Axel Lange, Joerg Schors, Oliver Wald
Proceedings Volume 5766, (2005) https://doi.org/10.1117/12.601886
KEYWORDS: Scattering, X-rays, X-ray diffraction, Composites, Crystals, Polymers, Laser scattering, Diffraction, X-ray microscopy, Carbon
Proceedings Article | 9 May 2005 Paper
Micro-mechanical properties of fiber composites characterized by X-ray refraction
Proceedings Volume 5766, (2005) https://doi.org/10.1117/12.600967
KEYWORDS: Refraction, X-rays, Composites, Failure analysis, Absorption, Fiber reinforced polymers, Glasses, Interfaces, Fiber characterization, Scanning electron microscopy
Proceedings Article | 9 May 2005 Open Access Paper
X-ray refraction topography and computed tomography for NDE of lightweight materials
Bernd Mueller, Axel Lange, Michael Harwardt, Manfred Hentschel, Bernhard Illerhaus, Juergen Goebbels, Joachim Bamberg, Falko Heutling
Proceedings Volume 5766, (2005) https://doi.org/10.1117/12.599708
KEYWORDS: Refraction, X-rays, Composites, Crystals, Scattering, Absorption, Interfaces, Computed tomography, Nondestructive evaluation, Ceramics
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Proceedings Article | 21 July 2004 Open Access Paper
NDE of microstructured materials by x-ray diffraction and refraction topography
Manfred Hentschel, Axel Lange, K.-Wolfram Harbich, Joerg Schors, Oliver Wald, Bernd Mueller
Proceedings Volume 5392, (2004) https://doi.org/10.1117/12.541532
KEYWORDS: X-rays, Scattering, Refraction, X-ray diffraction, Carbon, Optical fibers, Composites, Laser scattering, Silicon carbide, Polymers
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Conference Committee Involvement (5)
Sensor Systems and Networks: Phenomena, Technology and Applications for NDE and Health Monitoring
19 March 2007 | San Diego, California, United States
Testing, Reliability, and Application of Micro- and Nano-Material Systems IV
1 March 2006 | San Diego, CA, United States
Advanced Sensor Technologies for NDE and Structural Health Monitoring II
1 March 2006 | San Diego, CA, United States
Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring
9 March 2005 | San Diego, CA, United States
Testing, Reliability, and Application of Micro- and Nano-Material Systems III
9 March 2005 | San Diego, CA, United States
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