Masatoshi Terayama
at Toshiba Corp
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 30 June 2012 Paper
Masatoshi Terayama, Hideaki Sakurai, Mari Sakai, Masamitsu Itoh, Hideo Funakoshi, Hideaki Iwasaka, Junko Iizuka, Mitsuaki Maruyama, Naoya Hayashi
Proceedings Volume 8441, 844105 (2012) https://doi.org/10.1117/12.979645
KEYWORDS: Extreme ultraviolet, Photomasks, Particles, Extreme ultraviolet lithography, Deep ultraviolet, Scanners, Non-optical lithography, Lithography, Manufacturing, Error analysis

Proceedings Article | 11 May 2009 Paper
Masatoshi Terayama, Hideaki Sakurai, Mari Sakai, Masamitsu Ito, Osamu Ikenaga, Hideo Funakoshi, Takahiro Shiozawa, Syoutarou Miyazaki, Yoshihiko Saito, Naoya Hayashi
Proceedings Volume 7379, 73791X (2009) https://doi.org/10.1117/12.824310
KEYWORDS: Ions, Line edge roughness, Line width roughness, Critical dimension metrology, Spatial frequencies, Photomasks, Photoresist processing, Halftones, Scanning electron microscopy, Fourier transforms

Proceedings Article | 17 October 2008 Paper
Hideaki Sakurai, Masatoshi Terayama, Mari Sakai, Masamitsu Itoh, Osamu Ikenaga, Hideo Funakoshi, Norifumi Sato, Kenji Nakamizo, Masato Nomura, Yoshihiko Saito, Junji Nakao, Naoya Hayashi
Proceedings Volume 7122, 71220D (2008) https://doi.org/10.1117/12.801424
KEYWORDS: Particles, Mask making, Metals, Polonium, Liquids, Control systems, Sensors, Error analysis, Atomic force microscopy, Temperature sensors

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