Mr. Muhammad Lutful Hai Profile

Muhammad Lutful Hai

PhD Student at Univ of Missouri

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 31 May 2012 Paper

M. Hai, M. Hesan, J. Lin, Q. Cheng, M. Jalal, A. Syllaios, S. Ajmera, M. Almasri

Proceedings Volume 8353, 835317 (2012) https://doi.org/10.1117/12.919708

KEYWORDS: Silicon, Oxygen, Germanium, Silicon films, Thin films, Temperature metrology, Microbolometers, Resistance, Oxides, X-ray diffraction

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Keywords/Phrases