Dr. Nasser H. Karam
Manager/Advanced Programs at Spectrolab Inc
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 24 June 2014 Paper
Proceedings Volume 9070, 907007 (2014) https://doi.org/10.1117/12.2053999
KEYWORDS: Diffusion, Indium gallium arsenide, Cameras, Short wave infrared radiation, Readout integrated circuits, Staring arrays, Array processing, Surveillance, Control systems, Quantum efficiency

Proceedings Article | 24 September 2013 Paper
Daniel Law, J. Boisvert, E. Rehder, P. Chiu, S. Mesropian, R. Woo, X. Liu, W. Hong, C. Fetzer, S. Singer, D. Bhusari, K. Edmondson, A. Zakaria, B. Jun, D. Krut, R. King, S. Sharma, N. Karam
Proceedings Volume 8876, 88760Y (2013) https://doi.org/10.1117/12.2026756
KEYWORDS: Solar cells, Germanium, Gallium arsenide, Semiconducting wafers, Semiconductors, Calibration, Indium gallium phosphide, External quantum efficiency, Group III-V semiconductors, Quantum efficiency

Proceedings Article | 3 November 2004 Paper
Jeffrey Warner, Robert Walters, Scott Messenger, Justin Lorentzen, Geoffrey Summers, Hector Cotal, Nassar Karam
Proceedings Volume 5520, (2004) https://doi.org/10.1117/12.559734
KEYWORDS: Calibration, Solar cells, Gallium arsenide, Quantum efficiency, Lamps, Indium gallium phosphide, Photovoltaics, Germanium, Optical filters, Light sources

Proceedings Article | 8 December 2003 Paper
Charles Morrison, Joseph Boisvert, Rengarajan Sudharsanan, Moran Haddad, Takahiro Isshiki, Dmitri Krut, Richard King, Nasser Karam
Proceedings Volume 5209, (2003) https://doi.org/10.1117/12.504799
KEYWORDS: Photodetectors, Germanium, Sensors, Resistance, Reliability, Telecommunications, Indium gallium arsenide, Semiconductor lasers, Diodes, Semiconducting wafers

Proceedings Article | 21 May 2002 Paper
Charles Morrison, Rengarajan Sudharsanan, Moran Haddad, Joseph Boisvert, Dmitri Krut, Richard King, Nasser Karam
Proceedings Volume 4650, (2002) https://doi.org/10.1117/12.467672
KEYWORDS: Germanium, Photodetectors, Capacitance, Resistance, Sensors, Doping, Diffusion, Optoelectronic devices, Measurement devices, Semiconducting wafers

Showing 5 of 7 publications
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