Dr. Peter He Profile

Dr. Peter He

at Tuskegee Univ

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Publications (1)

Proceedings Article | 10 March 2006 Paper

Multivariate visualization techniques in statistical process monitoring and their applications to semiconductor manufacturing

Q. Peter He

Proceedings Volume 6155, 615506 (2006) https://doi.org/10.1117/12.654945

KEYWORDS: Visualization, Principal component analysis, Visual analytics, Data modeling, Process control, Dynamical systems, Semiconductors, Semiconductor manufacturing, Data processing, Chemometrics

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