Pin Wang
at Nanyang Technological Univ
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 3 October 2008 Paper
Proceedings Volume 7155, 715511 (2008) https://doi.org/10.1117/12.814537
KEYWORDS: Laser induced damage, Phase shifts, Epoxies, Polarimetry, Phase shifting, Image processing, Imaging systems, Photoelasticity, Visible radiation, Calibration

Proceedings Article | 3 October 2008 Paper
Zhijia Lu, Pin Wang, Anand Asundi
Proceedings Volume 7155, 715512 (2008) https://doi.org/10.1117/12.814538
KEYWORDS: Silicon, Semiconducting wafers, Phase shifts, Infrared radiation, Stress analysis, Calibration, Photoelasticity, Wafer-level optics, Semiconductors, Phase shifting

Proceedings Article | 25 April 2008 Paper
Proceedings Volume 6995, 69950X (2008) https://doi.org/10.1117/12.782261
KEYWORDS: Liquid crystals, Birefringence, Phase shifts, Polarizers, Image analysis, Wave plates, LCDs, Aerospace engineering, Optical alignment, Light

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