Dr. Stuart W. Card
Chief Scientist at Critical Technologies Inc
SPIE Involvement:
Author
Area of Expertise:
information theory , machine learning , genetic programming , wireless networks , uncrewed vehicles , network trust
Publications (1)

Proceedings Article | 30 April 2009 Paper
Proceedings Volume 7347, 734703 (2009) https://doi.org/10.1117/12.820745
KEYWORDS: Data modeling, Feature selection, Statistical analysis, Process control, Analog electronics, Image information entropy, Facility engineering, Statistical modeling, Algorithm development, Data storage

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