Sungmin Jo
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 August 2023 Presentation + Paper
Proceedings Volume 12619, 126190G (2023) https://doi.org/10.1117/12.2680983
KEYWORDS: Scattering, Neural networks, Light scattering, Diffraction, Data modeling, Machine learning

SPIE Journal Paper | 20 April 2022 Open Access
JM3, Vol. 21, Issue 02, 021209, (April 2022) https://doi.org/10.1117/12.10.1117/1.JMM.21.2.021209
KEYWORDS: Semiconducting wafers, Cameras, Critical dimension metrology, Semiconductors, Spectral resolution, Spatial resolution, Hyperspectral imaging, Imaging systems, Metrology, Wafer-level optics

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