Takashi Iizuka
at HOYA Corp
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 20 April 2016 Paper
Daisuke Iba, Ricardo Rodriguez Lopez, Takahiro Kamimoto, Morimasa Nakamura, Nanako Miura, Takashi Iizuka, Arata Masuda, Ichiro Moriwaki, Akira Sone
Proceedings Volume 9803, 98034F (2016) https://doi.org/10.1117/12.2218951
KEYWORDS: Sensors, Printing, Electronic circuits, Laser sintering, Resistance, Optical microscopes, Manufacturing, Laser processing, Laser systems engineering

Proceedings Article | 20 October 1992 Paper
Masahito Niibe, Masami Tsukamoto, Takashi Iizuka, Akira Miyake, Yutaka Watanabe, Yasuaki Fukuda
Proceedings Volume 1720, (1992) https://doi.org/10.1117/12.132127
KEYWORDS: Reflectivity, X-rays, Transmission electron microscopy, Chromium, Mirrors, Moire patterns, Crystals, Grazing incidence, Nickel, Argon

Proceedings Article | 20 October 1992 Paper
Masami Tsukamoto, Masahito Niibe, Yutaka Watanabe, Akira Miyake, Takashi Iizuka, Yasuaki Fukuda, Yoshiaki Kato, Hiroyuki Shiraga, Hiroyuki Daido, Kensuki Murai, Ciaran Lewis, David Neely, Domhnail O'Neill
Proceedings Volume 1720, (1992) https://doi.org/10.1117/12.132129
KEYWORDS: Mirrors, X-rays, Plasma, Germanium, Particles, Reflectivity, X-ray lasers, Silicon, Light scattering, Multilayers

Proceedings Article | 1 February 1991 Paper
Masahito Niibe, Masami Hayashida, Takashi Iizuka, Akira Miyake, Yutaka Watanabe, Rie Takahashi, Yasuaki Fukuda
Proceedings Volume 1343, (1991) https://doi.org/10.1117/12.23172
KEYWORDS: Reflectivity, Argon, X-rays, Interfaces, Sputter deposition, Transmission electron microscopy, Chemical species, Acquisition tracking and pointing, Photomicroscopy, Molybdenum

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