Dr. Thomas Lacombe
at Univ of Auckland
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 8 August 2020
Pierre Nagorny, Thomas Lacombe, Hugues Favreliere, Maurice Pillet
JEI, Vol. 29, Issue 04, 041014, (August 2020) https://doi.org/10.1117/12.10.1117/1.JEI.29.4.041014
KEYWORDS: Polarimetry, Polarization, Sensors, Reflection, Cameras, Manufacturing, Feature extraction, Imaging systems, Image quality

Proceedings Article | 16 July 2019 Paper
P. Nagorny, T. Lacombe, T. Muller, H. Favreliere, E. Pairel, M. Pillet
Proceedings Volume 11172, 1117217 (2019) https://doi.org/10.1117/12.2522062
KEYWORDS: Polarization, Polarimetry, Machine learning, Sensors, Manufacturing, Feature extraction, Cameras, Defect detection, Control systems, Quality measurement, Defect inspection, Convolutional neural networks, Neural networks, Polarimetric sensing

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