Tom Neubert
at Forschungszentrum Jülich GmbH
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 19 October 2023 Open Access Presentation + Paper
Konstantin F. F. Ntokas, Jörn Ungermann, Martin Kaufmann, Tom Neubert, Martin Riese
Proceedings Volume 12730, 127300K (2023) https://doi.org/10.1117/12.2679980
KEYWORDS: Equipment, Temperature metrology, Atmospheric modeling, Air temperature

Proceedings Article | 5 October 2023 Open Access Presentation + Paper
Proceedings Volume 12689, 1268905 (2023) https://doi.org/10.1117/12.2677600
KEYWORDS: Stray light, Equipment, Optical surfaces, Temperature metrology, Stray light analysis, Heterodyning, Atmospheric optics, Air temperature, Spectrometers

Proceedings Article | 30 September 2022 Presentation + Paper
Josua Florczak, Konstantin Ntokas, Tom Neubert, Egon Zimmermann, Heinz Rongen, Uwe Clemens, Martin Kaufmann, Martin Riese, Stefan van Waasen
Proceedings Volume 12236, 1223603 (2022) https://doi.org/10.1117/12.2633124
KEYWORDS: Signal to noise ratio, Sensors, Remote sensing, Image sensors, Field programmable gate arrays, Detection and tracking algorithms, Digital filtering, System on a chip, Imaging systems

Proceedings Article | 12 July 2019 Open Access Paper
Jilin Liu, Tom Neubert, Denis Froehlich, Peter Knieling, Heinz Rongen, Friedhelm Olschewski, O. Wroblowski, Qiuyu Chen, Ralf Koppmann, Martin Riese, Martin Kaufmann
Proceedings Volume 11180, 111806M (2019) https://doi.org/10.1117/12.2536157
KEYWORDS: Sensors, CMOS sensors, Electronics, Calibration, Temperature metrology, Radiation effects, Satellites, Atmospheric sensing, Commercial off the shelf technology, Electrons

SPIE Journal Paper | 11 July 2019
Tom Neubert, Heinz Rongen, Denis Froehlich, Georg Schardt, Markus Dick, Tobias Nysten, Egon Zimmermann, Martin Kaufmann, Friedhelm Olschewski, Stefan van Waasen
JARS, Vol. 13, Issue 03, 032507, (July 2019) https://doi.org/10.1117/12.10.1117/1.JRS.13.032507
KEYWORDS: Electronics, Remote sensing, Sensors, Imaging systems, Satellites, Logic, Commercial off the shelf technology, Aluminum, Interfaces, System on a chip

Showing 5 of 6 publications
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