Wei Chen
at Xi'an Univ of Science and Technology
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 11 October 2010 Paper
Proceedings Volume 7656, 76562I (2010) https://doi.org/10.1117/12.863912
KEYWORDS: Optical components, Optical testing, Optics manufacturing, Interferometry, Data centers, Surface finishing, Time metrology, Polishing, Process modeling, Interferometers

Proceedings Article | 6 August 2009 Paper
Proceedings Volume 7383, 73833Q (2009) https://doi.org/10.1117/12.835394
KEYWORDS: Infrared radiation, Source localization, Thermography, Infrared imaging, Black bodies, Mining, Flame detectors, Temperature metrology, Visible radiation, Gases

Proceedings Article | 20 May 2009 Paper
Wei Chen, Guang-kuan Zhou, Yan-ying Ju, Bin Fan, Yong-jian Wan
Proceedings Volume 7283, 72834K (2009) https://doi.org/10.1117/12.828830
KEYWORDS: Optical components, Optical testing, Optics manufacturing, Binary data, Polishing, Data centers, Interferometry, Interferometers, Astronomical imaging, Edge detection

Proceedings Article | 20 May 2009 Paper
Proceedings Volume 7283, 72834J (2009) https://doi.org/10.1117/12.828829
KEYWORDS: Spatial frequencies, Wavefront aberrations, Wavefronts, Optical testing, Optical components, Interferometers, Surface roughness, Communication engineering, Phase measurement, Telecommunications

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