Wei Feng
Student at Sichuan Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 August 2015 Paper
Proceedings Volume 9623, 96231C (2015) https://doi.org/10.1117/12.2193484
KEYWORDS: 3D metrology, Heterodyning, Fringe analysis, CCD cameras, Imaging systems, Digital micromirror devices, Projection systems, Reliability, Information technology, Structured light

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