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Zhaomin Wang
at Nanyang Technological Univ
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Author
Publications (4)
SPIE Journal Paper | 20 March 2018
Depth profile measurement with lenslet images of the plenoptic camera
OE, Vol. 57, Issue 03, 033106, (March 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.3.033106
KEYWORDS: Microlens, Calibration, Microlens array, Optical engineering, Sensors, Error analysis, Detector arrays, Cameras, Image processing, Image resolution
Proceedings Article | 24 October 2017 Paper
A reflection TIE system for 3D inspection of wafer structures
Proceedings Volume 10458, 104580H (2017) https://doi.org/10.1117/12.2283071
KEYWORDS: 3D image reconstruction, Wafer inspection, Inspection, Opacity, Phase retrieval, Microscopes
Proceedings Article | 28 February 2014 Paper
Measurement of thermal effects in solid-state laser gain medium by digital holography
Xiaoyuan Peng, Yang Yu, Zhaomin Wang, Weijuan Qu, Chee Yuen Cheng, Saw Soon Yong, Yong Poo Chia
Proceedings Volume 8959, 895922 (2014) https://doi.org/10.1117/12.2039938
KEYWORDS: Thermal effects, Nd:YAG lasers, Digital holography, Crystals, Solid state lasers, Holograms, Laser crystals, YAG lasers, Semiconductor lasers, Rod lasers
Proceedings Article | 1 March 2013 Paper
Compound common-path digital holographic microscope
Weijuan Qu, Zhaomin Wang, Chee Yuen Cheng, Anand Asundi
Proceedings Volume 8644, 864414 (2013) https://doi.org/10.1117/12.2003755
KEYWORDS: Digital holography, Holography, Microscopes, Microscopy, Holograms, Reflection, Phase compensation, Wavefronts, Micro optics, Semiconducting wafers
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