Proc. SPIE. 9746, Ultrafast Phenomena and Nanophotonics XX, 97460W. (March 14, 2016) doi: 10.1117/12.2208572
Proc. SPIE. 10303, Gallium-Nitride-based Technologies, 1030302. (July 07, 2017) doi: 10.1117/12.482615
Proc. SPIE. 10303, Gallium-Nitride-based Technologies, 1030303. (July 07, 2017) doi: 10.1117/12.482620
Proc. SPIE. 10274, Handbook of Critical Dimension Metrology and Process Control, 102740C. (July 06, 2017) doi: 10.1117/12.187454
Proc. SPIE. 10274, Handbook of Critical Dimension Metrology and Process Control, 102740E. (July 06, 2017) doi: 10.1117/12.187456
Proc. SPIE. 10274, Handbook of Critical Dimension Metrology and Process Control, 102740G. (July 06, 2017) doi: 10.1117/12.187458
Proc. SPIE. 10270, Photorefractive Materials, Effects, and Applications, 102700G. (June 28, 2017) doi: 10.1117/12.178621
Proc. SPIE. 10267, Integrated Optics and Optoelectronics, 1026709. (June 27, 2017) doi: 10.1117/12.141418
Proc. SPIE. 10267, Integrated Optics and Optoelectronics, 102670F. (June 27, 2017) doi: 10.1117/12.141402
Proc. SPIE. 10267, Integrated Optics and Optoelectronics, 102670I. (June 27, 2017) doi: 10.1117/12.141405
Proc. SPIE. 10267, Integrated Optics and Optoelectronics, 102670T. (June 27, 2017) doi: 10.1117/12.141415
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI, 103301M. (June 26, 2017) doi: 10.1117/12.2270277
Opt. Eng. 2017; 56(6):067109. doi: 10.1117/1.OE.56.6.067109
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering, 1044916. (June 13, 2017) doi: 10.1117/12.2270595
Proc. SPIE. 10212, Advanced Photon Counting Techniques XI, 1021209. (June 09, 2017) doi: 10.1117/12.2264958
Proc. SPIE. 10180, Tri-Technology Device Refrigeration (TTDR) II, 1018009. (June 07, 2017) doi: 10.1117/12.2266121
Proc. SPIE. 10180, Tri-Technology Device Refrigeration (TTDR) II, 101800A. (June 07, 2017) doi: 10.1117/12.2264535
Proc. SPIE. 10193, Ultrafast Bandgap Photonics II, 1019306. (June 07, 2017) doi: 10.1117/12.2263280
Proc. SPIE. 10193, Ultrafast Bandgap Photonics II, 101930A. (June 07, 2017) doi: 10.1117/12.2262733
Proc. SPIE. 10206, Disruptive Technologies in Sensors and Sensor Systems, 1020606. (June 06, 2017) doi: 10.1117/12.2262799
Shibboleth is an access management service that provides single sign-on to protected resources. It replaces the multiple user names and passwords necessary to access subscription-based content with a single user name and password that can be entered once per session. It operates independently of a user's location or IP address. If your institution uses Shibboleth authentication, please contact your site administrator to receive your user name and password.
Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.
Shibboleth is access management services that provide single sign-on to protected resources. It replace the multiple user names and passwords necessary to access subscription-based content with a single user name and password that can be entered once per session. It operates independently of a user's location or IP address. If your institution uses Shibboleth authentication, please contact your site administrator to receive your user name and password.
