PROCEEDINGS VOLUME 3520
PHOTONICS EAST (ISAM, VVDC, IEMB) | 1-6 NOVEMBER 1998
Three-Dimensional Imaging, Optical Metrology, and Inspection IV
Editor(s): Kevin G. Harding, Donald J. Svetkoff, Katherine Creath, James S. Harris
Editor Affiliations +
PHOTONICS EAST (ISAM, VVDC, IEMB)
1-6 November 1998
Boston, MA, United States
Structured Light Methods I
Jussi Paakkari, Heikki J. Ailisto
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334321
Bernard R. Gilbert, Joel H. Blatt
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334331
Phillip C. Kalmanson, August Schutte, Chris L. Hart, Joel H. Blatt
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334342
Kevin G. Harding, Leonard H. Bieman
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334346
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334348
Structured Light Methods II
Ta Yuan, Murali Subbarao
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334349
Guowen Lu, Shudong Wu, Nicholas Palmer, Hongyu Liu
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334350
Hongyu Liu, Guowen Lu, Jonathan Jones, Daniel Komisarek, Shudong Wu
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334351
Bao Hua Zhuang, Wenwei Zhang
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334352
Alfonso Serrano-Heredia, Carlos M. Hinojosa, Juan Gutierrez Ibarra, Victor M. Arrizon
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334322
Xiaoyang Yu, Jian Zhang, Liying Wu, Juchun Lu, Qing Lin, Guihong Bi
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334323
Rangefinding Methods
Carsten Reich
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334324
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334325
Bernard A. Journet, Stephane Poujouly
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334326
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334327
Micromeasurements
Burkhard Huhnke, Gunnar Urbschat
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334328
Ferran Laguarta, Roger Artigas, Agusti Pinto, I. Al-Khatib
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334329
Per Gunnar Auran
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334330
Yasuhiro Takaya, Kazuhiro Wake, Motoki Izukura, Satoru Takahashi, Takashi Miyoshi
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334332
3D Modeling
Jean-Marc Philippe, Alain Bernard, Gabriel Ris
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334333
Songtao Li, Dongming Zhao
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334334
Y. He, Peihua Gu, K. Ferguson, J. Ronsky, R. Zernicke
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334335
Stephane Davillerd, Benoit Sidot, Alain Bernard, Gabriel Ris
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334336
Somia Mostafa El-Hefnawy, El-Sayed H. El-Konyaly
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334337
Holography/Speckle Methods and Interferometric Feature Measurements
Ralf Kaestle, Erwin K. Hack, Urs J. Sennhauser
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334338
Dukki Chung, Francis L. Merat, Fred M. Discenzo, James S. Harris
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334339
Tilo Pfeifer, Horst Konstantin Mischo, Andreas Ettemeyer, Zhiguo Wang, Ronny Wegner
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334340
Kaicheng Li, Miaoyuan Ye
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334341
Dalwoo Kim, Ki-Jang Oh, Choong-Soo Lim
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334343
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334344
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334345
3D Modeling
Vera Moiseevna Ginzburg
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (1998) https://doi.org/10.1117/12.334347
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