PROCEEDINGS VOLUME 3835
PHOTONICS EAST '99 | 19-22 SEPTEMBER 1999
Three-Dimensional Imaging, Optical Metrology, and Inspection V
Editor(s): Kevin G. Harding
Editor Affiliations +
IN THIS VOLUME

5 Sessions, 23 Papers, 0 Presentations
PHOTONICS EAST '99
19-22 September 1999
Boston, MA, United States
Optical Metrology Methods
Won Shik Park, Hyungsuck Cho, Yong-Kyu Byun, Noh Yeol Park, Dong Kwan Jung
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370248
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370258
Der-Chin Su, Ming-Horng Chiu, JuYi Lee
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370265
Ming-Horng Chiu, Jiun-You Lin, Der-Chin Su
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370266
Vitaly M. Podgaetsky, Sergei A. Tereshchenko, Alexander V. Smirnov, Nikolai S. Vorobiev
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370267
3D Applications I: Models
Alain Bernard
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370268
Alain Bernard, Stephane Davillerd, Benoit Sidot
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370269
Jonathan Alon, Stan Sclaroff
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370270
George G. Barton, Sidney Feldman, Jeffrey Andrew Beckstead
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370249
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370250
3D Applications II: Industrial Problems
Liviu Bursanescu, Maher Hamdi
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370251
Mats Blomquist, Ake V. Wernersson
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370252
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370253
German Da Costa, Jose Cataldo, Rafael Guarga, Gabriel Usera, Arturo Lezama, Felix Mosqueda
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370254
Vera Moiseevna Ginzburg
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370255
3D Structured Lighting Methods
Qingying Hu, Peisen S. Huang, Qionglin Fu, Fu-Pen Chiang
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370256
Franz Ulrich, John Ma, Leonard H. Bieman
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370257
Neville Maycock, August Schutte, Joel H. Blatt
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370259
Francisco M. Sanchez Moreno, Jose M. Sebastian y Zuniga, David Garcia, A. L. Martinez, J. M. Gonzalez
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370260
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370261
Poster Session
Haizhuang Kang, Clive Butler, Qingping Yang
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370262
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370263
Katsumi Tsujioka, Hideo Furuhashi, Kazuo Hatano, Shuntaro Higa, Yoshiyuki Uchida
Proceedings Volume Three-Dimensional Imaging, Optical Metrology, and Inspection V, (1999) https://doi.org/10.1117/12.370264
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