Front Matter: Volume 7387
Proceedings Volume Speckle 2010: Optical Metrology, 738701 (2010) https://doi.org/10.1117/12.871874
Speckle as a Tool in Security Techniques
Takashi Okamoto, Jun Mizobe
Proceedings Volume Speckle 2010: Optical Metrology, 738702 (2010) https://doi.org/10.1117/12.870723
Proceedings Volume Speckle 2010: Optical Metrology, 738703 (2010) https://doi.org/10.1117/12.870342
Fringe and Data Analysis, Phase Evaluation, and Unwrapping in Speckle Metrology
C. Trillo, A. F. Doval
Proceedings Volume Speckle 2010: Optical Metrology, 738704 (2010) https://doi.org/10.1117/12.870761
Proceedings Volume Speckle 2010: Optical Metrology, 738705 (2010) https://doi.org/10.1117/12.867642
H. Kadono, M. Kataoka, V. D. Madjarova
Proceedings Volume Speckle 2010: Optical Metrology, 738706 (2010) https://doi.org/10.1117/12.871117
Proceedings Volume Speckle 2010: Optical Metrology, 738707 (2010) https://doi.org/10.1117/12.870570
P. Günther, T. Pfister, J. Czarske
Proceedings Volume Speckle 2010: Optical Metrology, 738708 (2010) https://doi.org/10.1117/12.870756
Proceedings Volume Speckle 2010: Optical Metrology, 738709 (2010) https://doi.org/10.1117/12.868466
Digital Speckle Pattern Interferometry
Proceedings Volume Speckle 2010: Optical Metrology, 73870A (2010) https://doi.org/10.1117/12.870747
Proceedings Volume Speckle 2010: Optical Metrology, 73870B (2010) https://doi.org/10.1117/12.869665
Joris Soons, Joris J. J. Dirckx
Proceedings Volume Speckle 2010: Optical Metrology, 73870C (2010) https://doi.org/10.1117/12.870678
Pierre Slangen, Stephane Corn, Michel Fages, Jacques Raynal, Frederic J. G. Cuisinier
Proceedings Volume Speckle 2010: Optical Metrology, 73870D (2010) https://doi.org/10.1117/12.870748
Proceedings Volume Speckle 2010: Optical Metrology, 73870E (2010) https://doi.org/10.1117/12.870583
Marco Bova, Luigi Bruno, Andrea Poggialini
Proceedings Volume Speckle 2010: Optical Metrology, 73870F (2010) https://doi.org/10.1117/12.871142
Koichi Kobayashi, Hirofumi Kadono, Ichirou Yamaguchi
Proceedings Volume Speckle 2010: Optical Metrology, 73870G (2010) https://doi.org/10.1117/12.871220
Nondestructive Testing, Damage Detection, and Material Characterization
M. Feligiotti, E. Hack, G. Lampeas, T. Siebert, A. Pipino, A. Ihle
Proceedings Volume Speckle 2010: Optical Metrology, 73870H (2010) https://doi.org/10.1117/12.870759
Philipp Menner, Gerhard Busse
Proceedings Volume Speckle 2010: Optical Metrology, 73870I (2010) https://doi.org/10.1117/12.870758
Proceedings Volume Speckle 2010: Optical Metrology, 73870J (2010) https://doi.org/10.1117/12.870680
V. Muzet, P. Blain, D. Przybyla
Proceedings Volume Speckle 2010: Optical Metrology, 73870K (2010) https://doi.org/10.1117/12.868951
Micro-measuremens and Industrial Applications
Proceedings Volume Speckle 2010: Optical Metrology, 73870L (2010) https://doi.org/10.1117/12.877497
Proceedings Volume Speckle 2010: Optical Metrology, 73870M (2010) https://doi.org/10.1117/12.871522
Robert Schmitt, Guilherme Mallmann
Proceedings Volume Speckle 2010: Optical Metrology, 73870N (2010) https://doi.org/10.1117/12.870754
Proceedings Volume Speckle 2010: Optical Metrology, 73870O (2010) https://doi.org/10.1117/12.868299
Conventional and Digital Holography, and Holographic Interferometry
Yukihiro Ishii, Kazuki Yoshida
Proceedings Volume Speckle 2010: Optical Metrology, 73870P (2010) https://doi.org/10.1117/12.871591
Proceedings Volume Speckle 2010: Optical Metrology, 73870Q (2010) https://doi.org/10.1117/12.870196
Leszek R. Jaroszewicz, Małgorzata Kujawińska, Karol Stasiewicz, Bartłomiej Siwicki, Sławomir Wójcik, Paweł Marć
Proceedings Volume Speckle 2010: Optical Metrology, 73870R (2010) https://doi.org/10.1117/12.870785
Proceedings Volume Speckle 2010: Optical Metrology, 73870S (2010) https://doi.org/10.1117/12.868449
Proceedings Volume Speckle 2010: Optical Metrology, 73870T (2010) https://doi.org/10.1117/12.871951
Ángel F. Doval, Cristina Trillo
Proceedings Volume Speckle 2010: Optical Metrology, 73870U (2010) https://doi.org/10.1117/12.870049
Speckles: Theory and Fundamentals
Proceedings Volume Speckle 2010: Optical Metrology, 73870V (2010) https://doi.org/10.1117/12.870928
Proceedings Volume Speckle 2010: Optical Metrology, 73870W (2010) https://doi.org/10.1117/12.870936
Thomas Bodendorfer, Alexander W. Koch
Proceedings Volume Speckle 2010: Optical Metrology, 73870X (2010) https://doi.org/10.1117/12.870003
Gustavo E. Galizzi, Jeremy M. Coupland, Pablo D. Ruiz
Proceedings Volume Speckle 2010: Optical Metrology, 73870Y (2010) https://doi.org/10.1117/12.870257
Proceedings Volume Speckle 2010: Optical Metrology, 73870Z (2010) https://doi.org/10.1117/12.870757
Nondestructive Testing, Damage Detection, and Material Characterization II
Y. Arai, M. Kikukawa, S. Yokozeki
Proceedings Volume Speckle 2010: Optical Metrology, 738710 (2010) https://doi.org/10.1117/12.870461
Nikolai I. Mukhurov, Nikolay A. Khilo, Alexander G. Maschenko
Proceedings Volume Speckle 2010: Optical Metrology, 738711 (2010) https://doi.org/10.1117/12.869942
Intellectual Property
Proceedings Volume Speckle 2010: Optical Metrology, 738712 (2010) https://doi.org/10.1117/12.872495
Low Coherence and White Speckle Interferometry
Kay Gastinger, Lars Johnsen
Proceedings Volume Speckle 2010: Optical Metrology, 738713 (2010) https://doi.org/10.1117/12.871609
Proceedings Volume Speckle 2010: Optical Metrology, 738714 (2010) https://doi.org/10.1117/12.871532
Yves Delacrétaz, Daniel Boss, Florian Lang, Christian Depeursinge
Proceedings Volume Speckle 2010: Optical Metrology, 738715 (2010) https://doi.org/10.1117/12.870742
Dynamic Speckle
Proceedings Volume Speckle 2010: Optical Metrology, 738716 (2010) https://doi.org/10.1117/12.870934
Marcelo Guzman, Gustavo J. Meschino, Ana L. Dai Pra, Marcelo Trivi, Lucía I. Passoni, Héctor Rabal
Proceedings Volume Speckle 2010: Optical Metrology, 738717 (2010) https://doi.org/10.1117/12.870688
Robson Pierangeli Godinho, Roberto A. Braga Jr.
Proceedings Volume Speckle 2010: Optical Metrology, 738718 (2010) https://doi.org/10.1117/12.870719
Pierre Slangen, Laurent Aprin, Frédéric Heymes, Sébastien Equis, Pierre Jacquot
Proceedings Volume Speckle 2010: Optical Metrology, 738719 (2010) https://doi.org/10.1117/12.870746
J. K. Marques, R. A Braga, J. Pereira
Proceedings Volume Speckle 2010: Optical Metrology, 73871A (2010) https://doi.org/10.1117/12.870002
René Restrepo, Néstor Uribe-Patarroyo, Daniel Garranzo, José M. Pintado, Malte Frovel, Tomás Belenguer
Proceedings Volume Speckle 2010: Optical Metrology, 73871B (2010) https://doi.org/10.1117/12.870673
Biomedical Research and Speckle Noise Reduction
María del Socorro Hernández-Montes, Fernando Mendoza-Santoyo, Silvino Muñoz-Solís
Proceedings Volume Speckle 2010: Optical Metrology, 73871C (2010) https://doi.org/10.1117/12.870813
T. K. Lee, L. Tchvialeva, H. Lui, H. Zeng, D. I. McLean
Proceedings Volume Speckle 2010: Optical Metrology, 73871D (2010) https://doi.org/10.1117/12.870692
S, Rosendahl, E. Hällstig, P. Gren, M. Sjödahl
Proceedings Volume Speckle 2010: Optical Metrology, 73871E (2010) https://doi.org/10.1117/12.869659
G. Ouyang, Z. Tong, W. Gao, K. Wang, M. N. Akram, V. Kartashov, X. Y. Chen
Proceedings Volume Speckle 2010: Optical Metrology, 73871F (2010) https://doi.org/10.1117/12.869886
Closing Lecture
Proceedings Volume Speckle 2010: Optical Metrology, 73871G (2010) https://doi.org/10.1117/12.873356
Poster Session
Proceedings Volume Speckle 2010: Optical Metrology, 73871H (2010) https://doi.org/10.1117/12.868315
P. Rodríguez-Gómez, J. Carlos López-Vázquez, Cristina Trillo, Ángel F Doval, José L. Fernández
Proceedings Volume Speckle 2010: Optical Metrology, 73871I (2010) https://doi.org/10.1117/12.870769
Dênis T. Goto, Roger M. Groves
Proceedings Volume Speckle 2010: Optical Metrology, 73871J (2010) https://doi.org/10.1117/12.870572
G. Hernán Sendra, Ana L. Dai Pra, Lucia I. Passoni, Ricardo Arizaga, Hector J. Rabal, Marcelo Trivi
Proceedings Volume Speckle 2010: Optical Metrology, 73871K (2010) https://doi.org/10.1117/12.870682
J. V. L. Botega, R. A. Braga, M. P. P. Machado, L. A. Lima, G. F. Rabelo, R. R. Cardoso
Proceedings Volume Speckle 2010: Optical Metrology, 73871L (2010) https://doi.org/10.1117/12.869766
J. Molimard, A. E. Dolinko
Proceedings Volume Speckle 2010: Optical Metrology, 73871M (2010) https://doi.org/10.1117/12.871265
Xinzhong Li, Yuping Tai, Zhiqiang Zhen, Qingdong Chen, Liben Li
Proceedings Volume Speckle 2010: Optical Metrology, 73871N (2010) https://doi.org/10.1117/12.868575
Proceedings Volume Speckle 2010: Optical Metrology, 73871O (2010) https://doi.org/10.1117/12.869422
Proceedings Volume Speckle 2010: Optical Metrology, 73871P (2010) https://doi.org/10.1117/12.869420
Vladimir Kartashov, Muhammad Nadeem Akram
Proceedings Volume Speckle 2010: Optical Metrology, 73871Q (2010) https://doi.org/10.1117/12.868117
Wenhong Gao, Vladimir Kartashov, Guangmin Ouyang, Zhaomin Tong, Muhammad Nadeem Akram, Xuyuan Chen
Proceedings Volume Speckle 2010: Optical Metrology, 73871R (2010) https://doi.org/10.1117/12.870331
Z. M. Tong, G. M. Ouyang, W. H. Gao, M. N. Akram, V. Kartashov, K. Y. Wang, X. Y. Chen
Proceedings Volume Speckle 2010: Optical Metrology, 73871S (2010) https://doi.org/10.1117/12.868999
Proceedings Volume Speckle 2010: Optical Metrology, 73871T (2010) https://doi.org/10.1117/12.871433
Proceedings Volume Speckle 2010: Optical Metrology, 73871U (2010) https://doi.org/10.1117/12.870674
Proceedings Volume Speckle 2010: Optical Metrology, 73871V (2010) https://doi.org/10.1117/12.870767
A. O. Pino, J. Pladellorens, J. F. Colom
Proceedings Volume Speckle 2010: Optical Metrology, 73871W (2010) https://doi.org/10.1117/12.869655
R. Kumamoto, J. Frejlich
Proceedings Volume Speckle 2010: Optical Metrology, 73871X (2010) https://doi.org/10.1117/12.870679
A. E. Dolinko, J. Molimard, G. H. Kaufmann
Proceedings Volume Speckle 2010: Optical Metrology, 73871Y (2010) https://doi.org/10.1117/12.871263
Proceedings Volume Speckle 2010: Optical Metrology, 73871Z (2010) https://doi.org/10.1117/12.871200
Proceedings Volume Speckle 2010: Optical Metrology, 738720 (2010) https://doi.org/10.1117/12.867643
Digital Library Paper
M. Kujawinska, R. Sitnik, G. Dymny, M. Malesa, K. Malowany, D. Szczepanek
Proceedings Volume Speckle 2010: Optical Metrology, 738721 (2010) https://doi.org/10.1117/12.883978
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