PROCEEDINGS VOLUME 8896
SPIE SECURITY + DEFENCE | 23-26 SEPTEMBER 2013
Electro-Optical and Infrared Systems: Technology and Applications X
Editor Affiliations +
Proceedings Volume 8896 is from: Logo
SPIE SECURITY + DEFENCE
23-26 September 2013
Dresden, Germany
Front Matter: Volume 8896
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889601 (2013) https://doi.org/10.1117/12.2051252
Optics and Materials
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889602 (2013) https://doi.org/10.1117/12.2028902
C. Pernechele
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889603 (2013) https://doi.org/10.1117/12.2028099
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889604 (2013) https://doi.org/10.1117/12.2028716
Active Sensing
Frank Christnacher, Martin Laurenzis, Stéphane Schertzer
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889606 (2013) https://doi.org/10.1117/12.2028347
M. Laurenzis, E. Bacher, S. Schertzer, F. Christnacher
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889607 (2013) https://doi.org/10.1117/12.2028354
Yves Lutz, Jean-Michel Poyet, Nicolas Metzger
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889608 (2013) https://doi.org/10.1117/12.2028635
Fritjof Büttner, Jan Hagemann, Mike Wellhausen, Sebastian Funke, Christoph Lenth, Frank Rotter, Lars Gundrum, Ulrich Plachetka, Christian Moormann, et al.
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889609 (2013) https://doi.org/10.1117/12.2028736
Yuan Wu, Pang Bian, Bo Jia, Qian Xiao
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960A (2013) https://doi.org/10.1117/12.2028311
Detectors
Y. Reibel, A. Rouvie, A. Nedelcu, T. Augey, N. Pere-Laperne, L. Rubaldo, D. Billon-Lanfrey, O. Gravrand, J. Rothman, et al.
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960B (2013) https://doi.org/10.1117/12.2030698
F. Rutz, P. Kleinow, R. Aidam, W. Bronner, L. Kirste, M. Walther
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960C (2013) https://doi.org/10.1117/12.2026879
Yongqian Li, Yongjun Guo, Lei Su, Binbin Wang, Zheng Xu, Zili Zhou
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960E (2013) https://doi.org/10.1117/12.2031060
Protection and Threat Detection
G. Ritt, D. Walter, B. Eberle
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960G (2013) https://doi.org/10.1117/12.2029083
Tomer Merhav, Vitali Savuskan, Yael Nemirovsky
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960H (2013) https://doi.org/10.1117/12.2026923
Carl Brännlund, Jonas Tidström, Markus Henriksson, Lars Sjöqvist
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960I (2013) https://doi.org/10.1117/12.2028846
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960J (2013) https://doi.org/10.1117/12.2029331
Imager Testing, Calibration and Simulation
Daniel Winters, Patrik Erichsen
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960K (2013) https://doi.org/10.1117/12.2029541
Catherine Barrat, Gildas Chauvel
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960L (2013) https://doi.org/10.1117/12.2028874
Jeeyeon Yoon, Dongok Ryu, Sangmin Kim, Sehyun Seong, Jieun Kim, Sug-Whan Kim, Woongsup Yoon
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960M (2013) https://doi.org/10.1117/12.2029245
Imaging Systems
Mark E. Bray, Robert A. Shears
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960O (2013) https://doi.org/10.1117/12.2028735
Ann-Kristin Grosselfinger, David Münch, Wolfgang Hübner, Michael Arens
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960P (2013) https://doi.org/10.1117/12.2027311
Dario Cabib, Moshe Lavi, Amir Gil, Eran Ohel, Jacob Dolev, Uri Milman
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960R (2013) https://doi.org/10.1117/12.2029524
Serdar Cakir, Hande Uzeler, Tayfun Aytaç
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960S (2013) https://doi.org/10.1117/12.2029878
Hande Uzeler, Serdar Cakir, Tayfun Aytaç
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960T (2013) https://doi.org/10.1117/12.2030104
Poster Session
Shanping Jiang, Linhua Yang, Jie Xu, Jiang Yu
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960W (2013) https://doi.org/10.1117/12.2027507
Jie Xu, Shanping Jiang, Qingsheng Xiao, Pengsong Zhang, Linhua Yang, Hongsong Li, Yanhong Xiang
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960X (2013) https://doi.org/10.1117/12.2027353
Slawomir Gogler, Grzegorz Bieszczad, Michal Krupinski
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960Y (2013) https://doi.org/10.1117/12.2028859
Piotr Trzaskawka, Mariusz Kastek, Marek Życzkowski, Rafał Dulski, Mieczysław Szustakowski, Wiesław Ciurapiński, Jarosław Bareła
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 88960Z (2013) https://doi.org/10.1117/12.2028740
Jarosław Bareła, Mariusz Kastek, Krzysztof Firmanty, Piotr Trzaskawka
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889610 (2013) https://doi.org/10.1117/12.2028703
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889611 (2013) https://doi.org/10.1117/12.2028633
Xinling Tian, Xuli Liu, Mintao Tan, Weihua Wang, Danfeng Li
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889612 (2013) https://doi.org/10.1117/12.2028986
Sebastian Lehmann, Martin Ebermann, Norbert Neumann
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889613 (2013) https://doi.org/10.1117/12.2029302
Jan Kischkat, Sven Peters, Mykhaylo P. Semtsiv, Tristan Wegner, Mikaela Elagin, Grygorii Monastyrskyi, Yuri Flores, Sergii Kurlov, W. Ted Masselink
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889614 (2013) https://doi.org/10.1117/12.2029336
Jinxiang Fan, Jianyu Yang
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889615 (2013) https://doi.org/10.1117/12.2032443
Songlin Yu, Chunsheng Wang
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889616 (2013) https://doi.org/10.1117/12.2026649
R. Dulski, J. Bareła, P. Trzaskawka, T. Piątkowski
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889617 (2013) https://doi.org/10.1117/12.2028507
Zhijun Tu, Zhiwu Mei, Jun Yuan, Loulou Deng
Proceedings Volume Electro-Optical and Infrared Systems: Technology and Applications X, 889618 (2013) https://doi.org/10.1117/12.2028970
Back to Top