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The coherence of EUV radiation is extremely important for many experiments based on diffraction or interference and thus knowledge of coherence degree is one of the key parameter of all real partially coherent sources. We present a single shot method based on evaluation of far field diffraction pattern from specially designed diffraction masks. Several measurements of a beam of Ne-like Zn X-ray laser were performed with 1D and 2D masks showing an expected pattern of degree of coherence for this type of source.
Martin Albrecht,Michaela Kozlová,Miroslav Krus, andJaroslav Nejdl
"Single shot coherence studies of plasma based X-ray laser", Proc. SPIE PC12582, Compact Radiation Sources from EUV to Gamma-rays: Development and Applications, PC1258202 (8 June 2023); https://doi.org/10.1117/12.2665804
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Martin Albrecht, Michaela Kozlová, Miroslav Krus, Jaroslav Nejdl, "Single shot coherence studies of plasma based X-ray laser," Proc. SPIE PC12582, Compact Radiation Sources from EUV to Gamma-rays: Development and Applications, PC1258202 (8 June 2023); https://doi.org/10.1117/12.2665804