Paper
1 January 1981 Single Photon X-Ray Imaging With Charge-Coupled Devices (CCDs)
R. E. Griffiths, G. Polucci, A. Mak, S. S. Murray, D. A. Schwartz
Author Affiliations +
Abstract
A brief description is given of a CCD camera facility which has been designed and built for testing and characterization of CCDs in response to single X-ray photons of energy ~ 1 - 10 keV. The camera system facilitates ease of change from one type of CCD to another. Results are described from the frontside illuminated Fairchild 211 and 221 area imagers, and the disadvantages of commercially available devices are discussed. Preliminary results are presented. from (100 x 200) CCD arrays manufactured under contract by Westinghouse on high-resistivity silicon for deep depletion.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. E. Griffiths, G. Polucci, A. Mak, S. S. Murray, and D. A. Schwartz "Single Photon X-Ray Imaging With Charge-Coupled Devices (CCDs)", Proc. SPIE 0290, Solid-State Imagers for Astronomy, (1 January 1981); https://doi.org/10.1117/12.965838
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Charge-coupled devices

X-rays

Imaging systems

CCD cameras

Sensors

X-ray imaging

Silicon

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