High Throughput Testing

A. H. Marshall; R. K. Buchness; D. F. Schmunk; L. F. Vasel

doi:10.1117/12.932810

30 June 1982 High Throughput Testing

A. H. Marshall, R. K. Buchness, D. F. Schmunk, L. F. Vasel

Proceedings Volume 0311, Mosaic Focal Plane Methodologies II; (1982) https://doi.org/10.1117/12.932810
Event: 25th Annual Technical Symposium, 1981, San Diego, United States

Abstract

Several IFPA programs having large quantities of deliverable devices provided Rockwell with the necessity of solving the many problems associated with high volume production. The facility contains processing, assembly, and cryogenic testing equipment.

Citation Download Citation

A. H. Marshall, R. K. Buchness, D. F. Schmunk, and L. F. Vasel "High Throughput Testing", Proc. SPIE 0311, Mosaic Focal Plane Methodologies II, (30 June 1982); https://doi.org/10.1117/12.932810

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