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The results of high angular resolution grazing incidence scattering measurements of highly polished, coated optical flats in the X-ray spectral range of 1.5 to 6.4 κeV are reported. The interpretation of these results in terms of surface microtopography is presented and the implications for grazing incidence X-ray imaging are discussed.
Martin V. Zombeck,Heinrich Brauninger,Axel Ondrusch, andPeter Predehl
"High Resolution X-Ray Scattering Measurements", Proc. SPIE 0316, High Resolution Soft X-Ray Optics, (24 March 1982); https://doi.org/10.1117/12.933152
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Martin V. Zombeck, Heinrich Brauninger, Axel Ondrusch, Peter Predehl, "High Resolution X-Ray Scattering Measurements," Proc. SPIE 0316, High Resolution Soft X-Ray Optics, (24 March 1982); https://doi.org/10.1117/12.933152