Optical micro-scanning zero calibration for a thermal microscope imaging system

Mei-Jing Gao; Xu Jie; Ai-Ling Tan; Wei-Long Wu

doi:10.1117/12.2246840

1 November 2016 Optical micro-scanning zero calibration for a thermal microscope imaging system

Mei-Jing Gao, Xu Jie, Ai-Ling Tan, Wei-Long Wu

Author Affiliations +

Proceedings Volume 10157, Infrared Technology and Applications, and Robot Sensing and Advanced Control; 101572F (2016) https://doi.org/10.1117/12.2246840
Event: International Symposium on Optoelectronic Technology and Application 2016, 2016, Beijing, China

Abstract

To improve the spatial resolution of the thermal microscope imaging system, the micro-scanning zero point should be determined. Based on geometric principles, a new technique for zero calibration by using an image registration algorithm is presented. The aim of the technique is to obtain the size and direction of the zero calibration angles by estimating the displacement between two thermal microscope images. The simulations and experiments are conducted separately before and after the zero calibration is determined. Our main results show that the proposed technique can effectively improve the thermal microscope imaging quality. Furthermore this technique can also be applied to other electro-optical imaging systems and improve their resolutions.

Citation Download Citation

Mei-Jing Gao, Xu Jie, Ai-Ling Tan, and Wei-Long Wu "Optical micro-scanning zero calibration for a thermal microscope imaging system", Proc. SPIE 10157, Infrared Technology and Applications, and Robot Sensing and Advanced Control, 101572F (1 November 2016); https://doi.org/10.1117/12.2246840

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