Paper
7 June 1989 A Set Of Instruments For Measuring Parameters Of Single Subnano- And Picosecond Signals
Yu. A. Golovastikov, Yu. V. Speranskii
Author Affiliations +
Proceedings Volume 1032, 18th Intl Congress on High Speed Photography and Photonics; (1989) https://doi.org/10.1117/12.969173
Event: 18th International Congress on High Speed Photography and Photonics, 1988, Xi'an, Shaanxi, China
Abstract
Present-day experimental physics and laser technology set forth increasingly high requirements to fast process parameters measuring means. Some 10 or 15 years ago, investigations were focused on processes of a nanose-cond duration (10-9 s), whereas today research demand measurements in pico (10-12) and femtosecond (10-15s) time ranges.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu. A. Golovastikov and Yu. V. Speranskii "A Set Of Instruments For Measuring Parameters Of Single Subnano- And Picosecond Signals", Proc. SPIE 1032, 18th Intl Congress on High Speed Photography and Photonics, (7 June 1989); https://doi.org/10.1117/12.969173
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KEYWORDS
CRTs

Signal processing

Picosecond phenomena

Digital signal processing

Ultrafast phenomena

Computing systems

High speed photography

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