Phase imaging using a single-pixel camera

Yoshio Hayasaki; Kazuki Ota

doi:10.1117/12.2270074

26 June 2017 Phase imaging using a single-pixel camera

Yoshio Hayasaki, Kazuki Ota

Proceedings Volume 10329, Optical Measurement Systems for Industrial Inspection X; 1032907 (2017) https://doi.org/10.1117/12.2270074
Event: SPIE Optical Metrology, 2017, Munich, Germany

Abstract

We demonstrate a phase imaging method based on a single-pixel camera based on a complex-amplitude representation to measure a surface profile of objects. The use of the complex-amplitude representation of the input signal and the phaseshifting technique enables us to perform the phase imaging of an object, that is, the profilometry. The complex-amplitude mask can directly represent the Hadamard patterns that have the positive and negative values. The complex-amplitude masks are displayed on phase modulation mode liquid crystal on silicon spatial light modulator (LCOS-SLM). Furthermore, the residual area is used for the reference beam with the phase shifting. Therefore, the phase imaging system with the coaxial structure has high stability for external disturbances.

Citation Download Citation

Yoshio Hayasaki and Kazuki Ota "Phase imaging using a single-pixel camera", Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 1032907 (26 June 2017); https://doi.org/10.1117/12.2270074

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