Increased Depth Of Focus In Scanning Microscope

Robert L. Whitman

doi:10.1117/12.955418

26 August 1977 Increased Depth Of Focus In Scanning Microscope

Robert L. Whitman

Proceedings Volume 0104, Multidisciplinary Microscopy; (1977) https://doi.org/10.1117/12.955418
Event: 1977 SPIE/SPSE Technical Symposium East, 1977, Reston, United States

Abstract

A technique is described which yields an increased depth of focus in a scanning microscope system. The technique's utility for certain types of objects is demonstrated experimentally.

Citation Download Citation

Robert L. Whitman "Increased Depth Of Focus In Scanning Microscope", Proc. SPIE 0104, Multidisciplinary Microscopy, (26 August 1977); https://doi.org/10.1117/12.955418

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