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In this work we compare two InAs/GaSb superlattice samples grown in MBE VIGO/MUT laboratory on 2 inch (001) GaAs substrate, using MBE technique. Both samples have the same architecture, however their growth processes were conducted at different temperatures. For sample A the growth temperature was equal 668 K (395°C), for sample B 588 K (315°C). Photoluminescence measurements were performed at 30 K. For sample A there is no photoluminescence signal, while spectrum for sample B consists of two peaks: bandgap peak at 0.5 eV and deep state peak at 0.25 eV. X-ray diffraction (XRD) measurements indicate that sample A has better crystallographic quality than sample B. Raman spectra consists of low energy peaks (20-100 cm-1) which confirm the existence of superlattice for both samples [4]. Additionally, for sample A there are peaks related to Sb precipitates. It suggests that except the InAs/GaSb superlattice there is an additional Sb layer which may disturb band structure of superlattice and cause the disappearance of photoluminescence for sample A.
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