Research on the influence of baffle in luminous flux measurement with integrating sphere

Fangsheng Lin; Tiecheng Li; Biyong Huang; Dejin Yin; Muyao Ji; Lei Lai; Ming Xia

doi:10.1117/12.2284390

24 October 2017 Research on the influence of baffle in luminous flux measurement with integrating sphere

Fangsheng Lin, Tiecheng Li, Biyong Huang, Dejin Yin, Muyao Ji, Lei Lai, Ming Xia

Author Affiliations +

Proceedings Volume 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics; 104600X (2017) https://doi.org/10.1117/12.2284390
Event: Applied Optics and Photonics China (AOPC2017), 2017, Beijing, China

Abstract

In the field of optical metrology, luminous flux is an important index to characterize the quality of light source. There are two kinds of method to measure it that one is light distribution surface method and the other is integrating sphere method. In the integrating sphere method, the baffle which is a key part of integrating sphere has important effects on the measurement results. The paper analyzes in detail the principle of an ideal integrating sphere. We change the relative position and shape of baffle inside the sphere during testing. By experiments, measured luminous flux values at different distances between the light source and baffle are obtained, which we used to take analysis of the effects of different baffle position and shape on the measurement. And then we obtain the optimum position and shape of baffle for luminous flux measurements. Based on the conclusion, we develop the methods and apparatus to improve the luminous flux measurement accuracy and reliability, which makes our unifying and transferring work of the luminous flux more accurate in East China and provides effective protection for our traceability system

Citation Download Citation

Fangsheng Lin, Tiecheng Li, Biyong Huang, Dejin Yin, Muyao Ji, Lei Lai, and Ming Xia "Research on the influence of baffle in luminous flux measurement with integrating sphere", Proc. SPIE 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics, 104600X (24 October 2017); https://doi.org/10.1117/12.2284390

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE