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5 March 2018 Degradation mechanism of dark signal of CCD exposed to 3MeV and 10MeV proton
Lin Wen, Yu-dong Li, Dong Zhou, Jie Feng, Qi Guo, Xing-yao Zhang, Xin Yu
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Proceedings Volume 10710, Young Scientists Forum 2017; 107100A (2018) https://doi.org/10.1117/12.2315065
Event: Young Scientists Forum 2017, 2017, Shanghai, China
Abstract
The radiation effects of protons will lead to degradation of dark signal of CCD. The degradation mechanism of dark signals of CCD are different due to the different proton energy. This paper investigated the radiation effects and annealing effects of CCD exposed to 3MeV and 10MeV proton. The test result shown that 3MeV proton irradiation induced CCD’s dark signal decreasing linearly following the proton fluence. The dark signal degradation induced by 10MeV was not linearly, due to the different defects introduced by proton with different energy. The results above indicates that the displacement damage behavior of defects introduced by 10MeV proton is more complex than 3MeV proton. There are more than two kinds of displacement damage defects dominating the increase of the dark signal. The results of this paper provided important reference for CCD’s proton radiation test method and evaluation technology.
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Lin Wen, Yu-dong Li, Dong Zhou, Jie Feng, Qi Guo, Xing-yao Zhang, and Xin Yu "Degradation mechanism of dark signal of CCD exposed to 3MeV and 10MeV proton", Proc. SPIE 10710, Young Scientists Forum 2017, 107100A (5 March 2018); https://doi.org/10.1117/12.2315065
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KEYWORDS
Charge-coupled devices
Annealing
Radiation effects
Particles
CCD image sensors
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