Paper
6 November 2018 Profile measurement using a self-mixing laser diode
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Abstract
When a fraction of external optical feedback re-enters inside cavity of a laser diode (LD), the laser intensity and its wavelength will thus be altered. The LD in this case is often called as a self-mixing laser diode (SMLD). This paper presents an SMLD for profile measurement. The LD is modulated by the injection current in triangular waveform and a target to be measured is installed on a mechanic scanning device. The reflection light by the target contains its surface profile. The profile information is then carried in the laser intensity and can be pickup by a photodiode packaged in the rear of the LD. We call this modulated laser intensity as self-mixing interferometric (SMI) signal. In this paper, a new algorithm is developed to retrieve the profile from the SMI signal. Results show that the proposed design is able to achieve the measurement of profile with high resolution.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Han Wang, Yuxi Ruan, Lingzhi Cao, Yanguang Yu, Jiangtao Xi, Qinghua Guo, Jun Tong, and Jitao Zhang "Profile measurement using a self-mixing laser diode", Proc. SPIE 10812, Semiconductor Lasers and Applications VIII, 1081211 (6 November 2018); https://doi.org/10.1117/12.2500739
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Cited by 1 scholarly publication.
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KEYWORDS
Modulation

Semiconductor lasers

Interferometry

Algorithm development

Signal detection

Phase measurement

Photodiodes

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