New insights into Fourier analysis on plane and convex holographic gratings for imaging spectrometers

Keming Zhang; Yinnian Liu; Youlong Ke; Yong Li; Min Xu

doi:10.1117/12.2505122

30 January 2019 New insights into Fourier analysis on plane and convex holographic gratings for imaging spectrometers

Keming Zhang, Yinnian Liu, Youlong Ke, Yong Li, Min Xu

Proceedings Volume 10841, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics; 1084104 (2019) https://doi.org/10.1117/12.2505122
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China

Abstract

As an optical element, diffraction grating is of considerable importance in many research fields. In this paper, Fourier analysis method is used to analyze the Fraunhofer diffraction phenomena of plane and convex holographic gratings under various conditions. Based on the transmittance function, the law of complex amplitude distribution, intensity distribution and spectral distribution on the diffraction screen is derived. For the planar and convex holographic gratings in the spectrometer design, the inherent laws of optical phenomena can be understood more deeply. In particular, the convex holographic gratings are analyzed as a combination of amplitude type plane grating and phase type spherical mirror, rather than being considered separately in most literature.

Citation Download Citation

Keming Zhang, Yinnian Liu, Youlong Ke, Yong Li, and Min Xu "New insights into Fourier analysis on plane and convex holographic gratings for imaging spectrometers", Proc. SPIE 10841, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics, 1084104 (30 January 2019); https://doi.org/10.1117/12.2505122

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KEYWORDS

Diffraction gratings

Diffraction

Holography

Astatine

Far-field diffraction

Fourier transforms

Mirrors

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