Paper
30 January 2019 Characteristics of a mid-wavelength infrared metalenses integrated imaging system
Xin Wu, Mizhen Wang
Author Affiliations +
Proceedings Volume 10841, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics; 108411B (2019) https://doi.org/10.1117/12.2506832
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China
Abstract
Metalenses highlight the potential of planar optics and can respond to the growing demand for miniaturization of conventional imaging lenses in portable and wearable electronic devices, computer vision, and microscopy. This paper characterized a set of mid-wavelength infrared (MWIR) metalenses operating at 4 μm. We derived the radius distribution of the nanopillar at each position based on rigorous coupled-wave analysis, then the metalenses were simulated with focal length f =14 μm and a total of 121 nanopillars by FDTD. Experimental results indicated that the focal spot size of the MWIR metalenses was close to the diffraction limit, and the field of view was as large as 50°. Most importantly, images captured by the MWIR metalenses had a comparable quality to the one by a conventional lens, while metalenses have the advantages of a smaller footprint and negligible weight, making them attractive for further deployment.
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Xin Wu and Mizhen Wang "Characteristics of a mid-wavelength infrared metalenses integrated imaging system", Proc. SPIE 10841, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics, 108411B (30 January 2019); https://doi.org/10.1117/12.2506832
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KEYWORDS
Mid-IR

Infrared imaging

Imaging systems

Infrared radiation

Finite-difference time-domain method

Diffraction

Lenses

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