Paper
22 March 2019 Defective products detection using adversarial AutoEncoder
Shunsuke Nakatsuka, Hiroaki Aizawa, Kunihito Kato
Author Affiliations +
Proceedings Volume 11049, International Workshop on Advanced Image Technology (IWAIT) 2019; 110490U (2019) https://doi.org/10.1117/12.2521371
Event: 2019 Joint International Workshop on Advanced Image Technology (IWAIT) and International Forum on Medical Imaging in Asia (IFMIA), 2019, Singapore, Singapore
Abstract
In this paper, we aimed at discrimination of defects under conditions where there is a large number of good products and a small number of defective products. Although automation of a visual inspection is essential to improve the quality of products, either or both of the features extracted by the experts and balanced dataset are needed. We tackled such a problem. By combining AAE, which can extract features following any distribution and Hotelling's T-Square, which is an effective anomaly detection method when data follows a normal distribution, it is possible to discriminate defects with a small number of defective samples.
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Shunsuke Nakatsuka, Hiroaki Aizawa, and Kunihito Kato "Defective products detection using adversarial AutoEncoder", Proc. SPIE 11049, International Workshop on Advanced Image Technology (IWAIT) 2019, 110490U (22 March 2019); https://doi.org/10.1117/12.2521371
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Cited by 2 scholarly publications.
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KEYWORDS
Feature extraction

Statistical analysis

Defect detection

Neural networks

Data modeling

Probability theory

Statistical modeling

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