Paper
24 January 2019 Transport-of-intensity equation (TIE) based phase imaging in a confocal laser scanning microscope
Author Affiliations +
Proceedings Volume 11052, Third International Conference on Photonics and Optical Engineering; 110520A (2019) https://doi.org/10.1117/12.2520343
Event: The International Conference on Photonics and Optical Engineering, 2018, Xi'an, China
Abstract
Conventional transport-of-intensity equation (TIE) based phase imaging is performed in wide-field microscopes. In this paper, we present phase and fluorescence dual-modality imaging in a confocal laser scanning microscopy (CLSM) system. To perform phase imaging, the depth of field (DOF) of the CLSM system was extended by using a tunable acoustic gradient index of refraction (TAG) lens. Under transmitted illumination, a few intensity images of a sample at different defocusing distances were recorded. The phase image is reconstructed from these intensity images by using transport-of-intensity equation (TIE). Fluorescence image is obtained by 3D scan of the sample, providing a 3D sectioned fluorescence image. The obtained dual-modality images with pixel-to-pixel correspondence provide for the same sample complementary information (structural/functional), to extract complex biological parameters. We demonstrate the combination of the two imaging modalities enables standalone determination of the refractive index of live cells.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juanjuan Zheng, Chao Zuo, and Peng Gao "Transport-of-intensity equation (TIE) based phase imaging in a confocal laser scanning microscope", Proc. SPIE 11052, Third International Conference on Photonics and Optical Engineering, 110520A (24 January 2019); https://doi.org/10.1117/12.2520343
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Phase imaging

Refractive index

Confocal microscopy

Imaging systems

Light scattering

Microscopes

Microscopy

Back to Top