Design techniques used to minimize impact of SEU's targeting microsemi FPGA's at the NIF target chamber

Bruce Dean; Matthew Dayton; Chris Macaraeg; Brad Funsten

doi:10.1117/12.2529806

25 October 2019 Design techniques used to minimize impact of SEU's targeting microsemi FPGA's at the NIF target chamber

Bruce Dean, Matthew Dayton, Chris Macaraeg, Brad Funsten

Author Affiliations +

Proceedings Volume 11114, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI; 1111418 (2019) https://doi.org/10.1117/12.2529806
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

The National Ignition Facility’s (NIF) high-yield DT shots create a harsh radiation environment that can cause electronics to malfunction. This paper documents various design tradeoffs and techniques used for a Microsemi FPGA to reduce the impact of Single Event Upsets (SEUs) that enable a camera to capture images in the NIF target chamber during a high-yield shot.

Conference Presentation

Citation Download Citation

Bruce Dean, Matthew Dayton, Chris Macaraeg, and Brad Funsten "Design techniques used to minimize impact of SEU's targeting microsemi FPGA's at the NIF target chamber", Proc. SPIE 11114, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI, 1111418 (25 October 2019); https://doi.org/10.1117/12.2529806

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