Thermoreflectance-based measurements of facet optical absorption in aged high-power diode lasers (Conference Presentation)

Aman Kumar Jha; Chen Li; Kevin P. Pipe; Mark T. Crowley; Daniel Fullager; Jason D. Helmrich; Prabhu Thiagarajan; Robert J. Deri; Rebecca B. Swertfeger; Paul O. Leisher

doi:10.1117/12.2547344

11 March 2020 Thermoreflectance-based measurements of facet optical absorption in aged high-power diode lasers (Conference Presentation)

Aman Kumar Jha, Chen Li, Kevin P. Pipe, Mark T. Crowley, Daniel Fullager, Jason D. Helmrich, Prabhu Thiagarajan, Robert J. Deri, Rebecca B. Swertfeger, Paul O. Leisher

Author Affiliations +

Proceedings Volume 11261, Components and Packaging for Laser Systems VI; 112610I (2020) https://doi.org/10.1117/12.2547344
Event: SPIE LASE, 2020, San Francisco, California, United States

Abstract

Light absorption at the facet of a high power diode laser can lead to severe heating and catastrophic optical damage. In this work, a combination of high resolution thermoreflectance imaging and a detailed heat transport model of the diode chip are used to measure facet absorption in diode lasers. This approach permits a direct measurement of the effectiveness of passivation layers in improving facet robustness and device lifetime. The ability to quantify facet absorption is an essential step toward enabling rapid development of alternative passivation technologies and improving the reliability and maximum output power of diode laser systems.

Conference Presentation

Citation Download Citation

Aman Kumar Jha, Chen Li, Kevin P. Pipe, Mark T. Crowley, Daniel Fullager, Jason D. Helmrich, Prabhu Thiagarajan, Robert J. Deri, Rebecca B. Swertfeger, and Paul O. Leisher "Thermoreflectance-based measurements of facet optical absorption in aged high-power diode lasers (Conference Presentation)", Proc. SPIE 11261, Components and Packaging for Laser Systems VI, 112610I (11 March 2020); https://doi.org/10.1117/12.2547344

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