Investigation of GeSn/SiGeSn nanostructured layer for sensors in mid-infrared application

Ravi Ranjan; Prakash Pareek; Saurabh K. Pandey; Sanjay Kumar; Jitendra K. Mishra

doi:10.1117/12.2555931

13 April 2020 Investigation of GeSn/SiGeSn nanostructured layer for sensors in mid-infrared application

Ravi Ranjan, Prakash Pareek, Saurabh K. Pandey, Sanjay Kumar, Jitendra K. Mishra

Proceedings Volume 11345, Nanophotonics VIII; 113452K (2020) https://doi.org/10.1117/12.2555931
Event: SPIE Photonics Europe, 2020, Online Only

Abstract

The Ge1-xSnx material system has been introduced as a potential solution for low-cost high-performance photodetector for short-wave infrared towards mid-infrared detections. An investigation of GeSn/SiGeSn nanostructure layer is reported for sensors for near and mid-infrared applications. Physics-based models will be developed for SiGeSn/GeSn based nanostructured sensors considering the carrier dynamics at hetero-interface, misfit dislocation and strain at the interface. We analyze the effect of biaxial strain on SiGeSn/GeSn alloys and determine the range of wavelength for the possible application in near and midinfrared range.

Conference Presentation

Citation Download Citation

Ravi Ranjan, Prakash Pareek, Saurabh K. Pandey, Sanjay Kumar, and Jitendra K. Mishra "Investigation of GeSn/SiGeSn nanostructured layer for sensors in mid-infrared application", Proc. SPIE 11345, Nanophotonics VIII, 113452K (13 April 2020); https://doi.org/10.1117/12.2555931

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