Paper
31 January 2020 Large scale stencil registration method based on two-node tree
Author Affiliations +
Proceedings Volume 11433, Twelfth International Conference on Machine Vision (ICMV 2019); 1143336 (2020) https://doi.org/10.1117/12.2557160
Event: Twelfth International Conference on Machine Vision, 2019, Amsterdam, Netherlands
Abstract
Large scale stencil images used for surface mount technology (SMT) always have more than ten thousand closed graphics(stencil holes). It is difficult to find corresponding information from those graphics in stencil image registration. Here, we propose a novel method which is based on two-node tree, differed from traditional ones. The two-node tree is special, which has only two nodes in a layer. It functions as selecting feature points. The set of feature points with the erroneous can find the most reasonable projection transformation model by the simplified RANSAC algorithm. We adopt different types of defective stencil images to verify the proposed method. Experimental results fully show its robustness and high-tolerant rate.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Man Luo, Xia Min, and Benxiong Huang "Large scale stencil registration method based on two-node tree", Proc. SPIE 11433, Twelfth International Conference on Machine Vision (ICMV 2019), 1143336 (31 January 2020); https://doi.org/10.1117/12.2557160
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KEYWORDS
Image registration

Visualization

Image processing

Data modeling

Defect detection

Image resolution

CCD cameras

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