A noncontact full-field flatness measuring system based on fringe projection

Duo Zhou; Changku Sun; Yingjie Zhang; Peng Wang

doi:10.1117/12.2549208

12 March 2020 A noncontact full-field flatness measuring system based on fringe projection

Duo Zhou, Changku Sun, Yingjie Zhang, Peng Wang

Proceedings Volume 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 114391B (2020) https://doi.org/10.1117/12.2549208
Event: 2019 International Conference on Optical Instruments and Technology, 2019, Beijing, China

Abstract

Flatness is one of the most important properties for quality control of manufacturing mechanical parts. The most widely applied coordinate measuring machine techniques of measuring flatness error are ineffective to collect abundant sample points, and the probes must contact the tested surface. Existing noncontact optical techniques are not full-field measurement and their devices are complex. This paper presents a simple but noncontact full-field flatness measuring system based on fringe projection profilometry technique. The designed device projects fringe patterns onto the tested surface, and by calculating the phase of modulated fringe images and calibrating the phase-height mapping relationship, the full-field surface sample points are acquired. Polarizers are applied to eliminate intense highlight of the measured surfaces. Optimization algorithm is introduced to determine the reference ideal plane and flatness error is then calculated. Several experiments are conducted to demonstrate that the proposed flatness measuring system can be applied to general mechanical parts, and it has high precision and high repeatability.

Citation Download Citation

Duo Zhou, Changku Sun, Yingjie Zhang, and Peng Wang "A noncontact full-field flatness measuring system based on fringe projection", Proc. SPIE 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 114391B (12 March 2020); https://doi.org/10.1117/12.2549208

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KEYWORDS

Cameras

Calibration

Projection systems

Polarizers

Clouds

Fringe analysis

Error analysis

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