Phase Spectroscopy Of Surface Electromagnetic Waves Using Fourier Spectrometer

L. A. Kuzik; V. A. Yakovlev; G. N. Zhizhin; M. A. Chesters; S. F. Parker

doi:10.1117/12.969468

1 December 1989 Phase Spectroscopy Of Surface Electromagnetic Waves Using Fourier Spectrometer

L. A. Kuzik, V. A. Yakovlev, G. N. Zhizhin, M. A. Chesters, S. F. Parker

Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969468
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States

Abstract

The surface electromagnetic wave (SEWS spectroscopy has shown high sensitivity to the state of the surface . The measurements of SEW attenuation andphase retardation during SEW propagation on the sample allow to obtain Ihe optical constants of surface layer or oxide on the metal. Up to now phase spectroscopy used laser sources of radiation, thus the interference measurements were done only in the spectral region where laser lines are available. To apply phase spectroscopy or SEW to the surface analysis widely it is necessary to expand the spectral region where they are studing. High sensitivity or modern Fourier transform spectrometers allows to detect SEW excited by broadband source. We have used Fourier transform spectrometers FTS-20V (Digilab) and Michelson-110 (BOMEM) with liquid nitrogen cooled detectors (Hg-Cd-Te). On silver surface SEW were excited using aperture coupling. The experiment is shown on the fig.1 . IR radiation from interferometer was focused on the gap between the sample 3 surface and the screen 1 placed at the distance of the order of 100 μm. In such a way on the gap propagating along a metal SEW and bulk radiation above the metal are excited.

Citation Download Citation

L. A. Kuzik, V. A. Yakovlev, G. N. Zhizhin, M. A. Chesters, and S. F. Parker "Phase Spectroscopy Of Surface Electromagnetic Waves Using Fourier Spectrometer", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); https://doi.org/10.1117/12.969468

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
2 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Spectroscopy

Metals

Silver

Electromagnetic radiation

Electromagnetic spectroscopy

Fourier transforms

Refractive index

Show All Keywords

Keywords/Phrases

Search In:

Publication Years