Improvement of accuracy of wide-surrounded multi-projection in indoor space

Kentaro Miura; Naoki Hashimoto

doi:10.1117/12.2566891

1 June 2020 Improvement of accuracy of wide-surrounded multi-projection in indoor space

Kentaro Miura, Naoki Hashimoto

Proceedings Volume 11515, International Workshop on Advanced Imaging Technology (IWAIT) 2020; 1151513 (2020) https://doi.org/10.1117/12.2566891
Event: International Workshop on Advanced Imaging Technologies 2020 (IWAIT 2020), 2020, Yogyakarta, Indonesia

Abstract

In this research, we aim to improve the accuracy of wide-area projection using multiple projectors and speed up the measurement for projection in an environment surrounded by walls such as indoor spaces. In previous efforts, we have realized a method for large-scale image projection easily, by projecting a pattern onto the indoor space and measuring with a combination of a normal lens and a fish-eye lens. However, when patterns are projected in the indoor space surrounded by walls, an area in which measurement cannot be performed correctly by indirect reflected light occurs, which causes distortion in the projection result. Therefore, we reduce the influence of indirect reflected light by dividing and projecting pattern light. In addition, focusing on the fact that indirect reflected light loses high-frequency components in its generation process, it is greatly reduced by a simple difference process based on the similarity of indirect reflected light of a sufficiently divided pattern image. On the other hand, such division of the pattern image increases the time required for grasping the shape of the space. Therefore, divided patterns are designed to reduce the number of them as much as possible using color information and an efficient division method while efficiently removing indirect reflected light.

Citation Download Citation

Kentaro Miura and Naoki Hashimoto "Improvement of accuracy of wide-surrounded multi-projection in indoor space", Proc. SPIE 11515, International Workshop on Advanced Imaging Technology (IWAIT) 2020, 1151513 (1 June 2020); https://doi.org/10.1117/12.2566891

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