Paper
30 January 1990 Image Scanning According To Lines On Finite Fields
Izidor Gertner
Author Affiliations +
Abstract
In this paper the radial digital image scan is considered. The main result of the paper is the number of radial digital lines needed to cover the image composed of pR x pR pixels, which is pR Application of such scan to detect defects on a silicon wafer is presented.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Izidor Gertner "Image Scanning According To Lines On Finite Fields", Proc. SPIE 1153, Applications of Digital Image Processing XII, (30 January 1990); https://doi.org/10.1117/12.962331
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Digital image processing

Image resolution

Image processing

Defect detection

Silicon

Digital imaging

Raster graphics

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