Surface Statistics Determined From IR Scatter

Tod F. Schiff; John C. Stover

doi:10.1117/12.962836

2 January 1990 Surface Statistics Determined From IR Scatter

Tod F. Schiff, John C. Stover

Proceedings Volume 1165, Scatter from Optical Components; (1990) https://doi.org/10.1117/12.962836
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

This paper examines the requirement for reflector "smoothness" that is imposed when BRDF data is used to calculate surface statistics. There are applications for use of these calculations at surfaces that appear rough at visible wavelengths (greater than about 300 angstroms). Wavelength extension into the mid IR and increasing the angle of incidence are the two techniques investigated. Experimental results are compared to two widely used diffraction calculations by using known sinusoidal gratings and the advantages and limitations of each are discussed. Extension of the calculations to surfaces that have surface features as large as 5000 angstroms has been demonstrated at a wavelength of 10.6 micrometers.

Citation Download Citation

Tod F. Schiff and John C. Stover "Surface Statistics Determined From IR Scatter", Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); https://doi.org/10.1117/12.962836

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