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Industrial inspection of processes by capture of speckle patterns often requires detection of a small activity area buried in a background. This work presents analysis of sensitivity of the dynamic speckle method by processing simulated and experimental correlated in time 8 bit encoded speckle patterns. Simulation of the patterns was done for an exponentially decreasing temporal correlation function of intensity fluctuations by Fresnel propagation of a monochromatic wave reflected from a delta-correlated in time phase screen and captured at different diameters and focal distances of the optical sensor objective lens. For the experiment, we used a 3D printed flat object with hollow sections that was covered with a transparent film and a droplet of a polymer solution and monitored the process of their drying. Both normalized and non-normalized processing algorithms were used.
E. Stoykova,N. Berberova,B. Blagoeva,D. Nazarova,L. Nedelchev, andA. Machikhin
"Recognition of small areas of activity by the pointwise intensity-based dynamic speckle analysis", Proc. SPIE 11782, Optical Measurement Systems for Industrial Inspection XII, 117821U (20 June 2021); https://doi.org/10.1117/12.2592600
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E. Stoykova, N. Berberova, B. Blagoeva, D. Nazarova, L. Nedelchev, A. Machikhin, "Recognition of small areas of activity by the pointwise intensity-based dynamic speckle analysis," Proc. SPIE 11782, Optical Measurement Systems for Industrial Inspection XII, 117821U (20 June 2021); https://doi.org/10.1117/12.2592600