Nonlinear response of high speed infrared electronic devices: calibration for high temperatures

Marie Dabos; Isabelle Ranc-Darbord; Marc Genetier; Nicolas Lecysyn; Khanh-Hung Tran; Gérard Baudin; Bruno Serio

doi:10.1117/12.2592574

20 June 2021 Nonlinear response of high speed infrared electronic devices: calibration for high temperatures

Marie Dabos, Isabelle Ranc-Darbord, Marc Genetier, Nicolas Lecysyn, Khanh-Hung Tran, Gérard Baudin, Bruno Serio

Proceedings Volume 11787, Automated Visual Inspection and Machine Vision IV; 117870N (2021) https://doi.org/10.1117/12.2592574
Event: SPIE Optical Metrology, 2021, Online Only

Conference Poster

Abstract

Recent advances in infrared sensor technologies made improvements in spatial resolution and frame rates. How- ever, these progresses have been done at the cost of other performances, such as the conversion of charge to voltage. This is especially problematic for fast emission spectroscopy, where an infrared camera measures the radiation that has been previously dispersed by a grating. In this situation, the measured radiation level is low even at high temperature, because of the spectral width (here, a 40 nm spectrum is dispersed over 488 pixels). Because of the size reduction of pixels, each one collects less energy. Calibration becomes challenging because it is carried out in conditions where the response of the detector is not linear. The work presented suggests the correction of the nonlinear response of an InSb sensor of a FLIR camera. Measurements with a former camera are used to correct the FLIR sensor's response with a linear and a logarithmic function. An application is presented with the temperature determination of a H₂, O₂, N₂, CO₂ and Al particles deflagration by spectroscopy.

Conference Presentation

Citation Download Citation

Marie Dabos, Isabelle Ranc-Darbord, Marc Genetier, Nicolas Lecysyn, Khanh-Hung Tran, Gérard Baudin, and Bruno Serio "Nonlinear response of high speed infrared electronic devices: calibration for high temperatures", Proc. SPIE 11787, Automated Visual Inspection and Machine Vision IV, 117870N (20 June 2021); https://doi.org/10.1117/12.2592574

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