Presentation
28 October 2021 Polychromatic and high dynamic range measurement of flat optics using a quadriwave lateral shearing wave-front sensor
Author Affiliations +
Proceedings Volume 11889, Optifab 2021; 1188906 (2021) https://doi.org/10.1117/12.2602534
Event: SPIE Optifab, 2021, Rochester, New York, United States
Abstract
The demand for large coated flat and curved optics is growing for applications in automotive (windshields, LIDAR windows) or space (spectrally resolved imaging, FSO Lasercom). Their large size leading to high Transmitted wavefront error (TWE) and their sensitivity to wavelength require new metrology instruments. We propose measuring the TWE of such optics with a quadriwave lateral shearing interferometer (QLSI) based wave front sensor, in a double-pass configuration. We present the instrument ability to measure optics in their full transmission spectral band. We also discuss the best strategy to characterize large TWE optics in dynamic ranges exceeding tens of microns.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aurélie Bétourné, Quentin Lorphelin, Marion Oudin, Bertille Ghesquière, Adrien Pallares, Valentin Genuer, and Benoit Wattellier "Polychromatic and high dynamic range measurement of flat optics using a quadriwave lateral shearing wave-front sensor", Proc. SPIE 11889, Optifab 2021, 1188906 (28 October 2021); https://doi.org/10.1117/12.2602534
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KEYWORDS
Wavefront sensors

Free space optics

High dynamic range imaging

Optical testing

Infrared detectors

Infrared radiation

Wavefronts

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