Paper
1 February 1990 Detection And Identification Of Visually Indiscernible Defects From Textural Background Of An Unpolished Quartz Crystal
Sing T. Bow, Ting Chen, Darrell E. Newell
Author Affiliations +
Proceedings Volume 1197, Automated Inspection and High-Speed Vision Architectures III; (1990) https://doi.org/10.1117/12.969950
Event: 1989 Symposium on Visual Communications, Image Processing, and Intelligent Robotics Systems, 1989, Philadelphia, PA, United States
Abstract
Quartz devices play an important role in the field of radio communication and are also well known for their popular use in electronic clocks and watches. Detection of scratches and cracks on the crystals is the key quality control in their production. Difficulties encountered in these inspections are due to the fact that such defects are so thin and short that they are almost indiscernible from the blurred textural background of the crystal unless a special illumination and torsional viewing mechanism are provided. In this paper, image processing and pattern recognition techniques are introduced for the automatic detection and delineation of these indiscernible imperfections so that high quality in crystal production can be assured.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sing T. Bow, Ting Chen, and Darrell E. Newell "Detection And Identification Of Visually Indiscernible Defects From Textural Background Of An Unpolished Quartz Crystal", Proc. SPIE 1197, Automated Inspection and High-Speed Vision Architectures III, (1 February 1990); https://doi.org/10.1117/12.969950
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KEYWORDS
Crystals

Quartz

Image segmentation

Image processing

Inspection

Pattern recognition

Digital image processing

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